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UHV AFM/STM

Variable Temperature UHV AFM/STM from RHK Technology

 

Ultra-High Vacuum AFM/STM

  • Ultra high vacuum (UHV) Atomic Force Microscope and Scanning Tunneling Microscope
  • Variable temperature stage
  • In situ microscopy of dynamic surface processes
  • Contact and non-contact AFM, and STM
  • Operation at variable temperature (200 K to over 1500 K) in ultrahigh vacuum (UHV) as well as in reactive gases at pressures up to ~ 1 atm
  • UHV sample preparation chamber
  • Residual gas analyzer

 

Reserve the tool

Instrument Owner: Guangwen Zhou

Binghamton University State University of New York
PO BOX 6000   Binghamton, NY 13902-6000
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The ADL is a component of the Small Scale Systems Integration and Packaging Center, a
New York State Center of Excellence. All rights reserved.

Last Updated: 5/31/13