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X-Ray Analysis Suite


This suite contains instruments that use x-rays as probe to study the physical and chemical structure of samples. X-ray Diffraction (XRD), small angle x-ray scattering (SAXS), x-ray imager and x-ray photoelectron Spectroscopy (XPS) systems are part of this suite. XRD system provides a wide range of applications such as crystal phase identification, rocking curve analysis and reciprocal space mapping, reflectometry and thin film phase analysis, residual stress and texture analysis. SAXS system yields information such as particle size, size distribution, including shape and orientation distribution of nanocrystals in liquids, powders and bulk samples. SAXS technique applications range from life science and biotechnology (proteins, viruses, DNA complexes) to polymers, emulsions, liquid crystals, fibers and catalysts. The high-resoltuion x-ray imaging machine uses x-rays to image interior of a sample non-destructively. This machine is also equipped with a CT scanner which is used to view the sample interior in 3D. This machine is used for non-destructive characterization of IC packages, BGAs, Flip chips, Bonded wafers, PCBs, Ceramic/ metals/ plastic components & compounds, material characterization & analysis, Medical devices & structures etc. The XPS system is used for elemental and chemical bonding state identification of the sample surface. Our XPS is capable of micro and macro area XPS analysis with the new focused x-ray spot technology as well as depth profiling, chemical state imaging, x-ray induced electron imaging and angle resolve analysis.


Binghamton University State University of New York
PO BOX 6000   Binghamton, NY 13902-6000

Last Updated: 4/9/10