Engineering and Science Research Labs and Equipment

Conductive Force Nanoprobe

Contact
Guangwen Zhou
AssistantProfessor, Mechanical Engineering Department
gzhou@binghamton.edu
607-777-5084

Location
BIO 1305

Description
The NanoFactory Instruments System SA2500.NE is an in-situ conductive force nano-probing system with a side entry double tilt TEM-NanoIndenter holder. The force probe sensor is integrated with a patented 3 dimensional approach mechanism providing a wide-range of sample/probe motions with sub-nanometer resolution. TEM imaging accurately positions the probe at the region of interest. The sensor/probe measures force and electric currents at specific locations on the specimen. This feature enables the in-situ studies of the electrical and mechanical properties of nanoscale structures.

Conductive Force Nanoprobe

Conductive Force Nanoprobe

Conductive Force Nanoprobe

Last Updated: 4/4/14