ENGINEERING AND SCIENCE RESEARCH LABS AND EQUIPMENT

Engineering and Science Buiilding

Optical Characterization System

Contact
Vladimir Nikulin
Associate Professor, Electrical and Computer Engineering Department
vnikulin@binghamton.edu
607-777-6956

Location
ES B205, B215

Description
Specialized characterization tools are the major research equipment our researchers use in the area of free space and semiconductor optics. The spectrum analyzer characterizes the frequency response of devices and when coupled with a sweep oscillator, characterizes frequency to high frequencies greater than 20GHz. The high speed oscilloscope provides high speed time-domain pulse information and allows pictures of pulse shapes in 1ns scale used for semiconductor lasers, remote sensing or high-speed communication. The optical spectrum analyzer, an essential tool, allows measurement of power versus wavelength. The tunable laser characterizes wavelength dependent properties of detectors and modulators and allows pulse light source generation. The beam analysis system allows power/energy and the profile of beam shape measurements. The liquid crystal spatial light modulator (LCSLM) is used for adaptive optics experiments and in nano-scale measurements.

Last Updated: 11/26/13